]M9600A 系列 PXI源表模块_弱信号/源表分析仪_通用测试仪器_产品中心

Power amplifiers and other components present a unique testing challenge: they draw rapid pulses of current. By offering superior transient performance, the M9111A SMU dramatically reduces the transient voltage drop due to pulsed loading and recovers quickly to its program voltage (even with capacitances of up to 150 μF). The M9111A provides industry-leading output stability under extreme, dynamic load conditions so that you never have to worry about your power source interfering with your measurements. The M9111A SMU’s glitch-free operation ensures that during programmed output or measurement ranges changes, the M9111A’s output voltage and current remain steady and the DUT remains unaffected. Further, to provide this output stability, the M9111A SMU has user-selectable compensation modes that improves usability and productivity by instantly configuring the SMU’s feedback loop to match the impedance of the system (DUT and wiring paths).

Accurately Measure Leakage and Dynamic Currents

Measuring static current accurately can be a challenge. Measuring dynamic currents from µA level to A is an even greater challenge. Depending on the level of current, a different precision measurement resistor must be used, representing a measurement range in the SMU. The three current measurement ranges (3 A, 1 mA, and 100 µA) of the M9111A makes it tuned to quickly and accurately measure the different operating states and power consumption of a device. The built-in measurement system enables fast measurement of low currents down to µA, even if the DUT has a large capacitor (up to 150 µF) and the built-in high-speed digitizer measures voltage and current every 5.12 µs (~200 ksamples/s).

Drivers and Soft Front Panel

To simplify system development, the M9111A comes with IVI.COM and IVI.C drivers for 32-bit and 64-bit Windows OS.

The soft front panel interface provides an easy way to monitor, configure, and control the M9111A SMU.

Address RF PA/FEM Test Challenges with a Reference Solution

The M9111A PXIe High-Speed SMU is a part of the Keysight RF Power Amplifier/Front End Modules (PA/FEM) Characterization and Test Reference Solution. This reference solution enables rapid, full characterization of next-generation power amplifier modules such as PAD devices, including S-parameter, demodulation, power, adjacent channel power and harmonic distortion measurements.

Use the reference solution to rapidly evaluate new test configurations or augment your existing test system with open source shortcuts.